X-Ray Microanalysis

Elemental analysis has been an integral part of any Electron Microscope analysis. Hitachi and several leading X-ray Microscopy manufacturers have partnered together to provide customers a complete solution for their analysis.
We offer several detectors for X-ray microanalysis applications, including No-LN configurations and new Silicon Drift detector technology for high-throughput applications. The highest resolution possible is always guaranteed on your column configuration.
We provides detectors for all currently available electron column instruments with custom-designed mechanical interfaces to assure vacuum integrity and optimum collection efficiency. These detectors can be interface to any SEM, LVSEM, FESEM, TEM, STEM, Probe, DRT, Dual Column FIB or Auger.
Combined with next generation X-ray microanalysis systems for traditional EDS and Spectral Imaging-based analysis, we provide a complete high-resolution, high-throughput solutions, from routine analysis to advanced research applications.